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. 2011 Apr 27;67(Pt 5):575–578. doi: 10.1107/S174430911100738X

Table 1. Summary of crystallographic data collection and processing.

Values in parentheses are for the highest resolution shell.

  Native P21 Native P21212
Beamline ESRF ID23-2 ESRF ID14-4
Wavelength (Å) 0.8726 0.9395
Resolution (Å) 50.0–3.00 54.2–2.60
Unit-cell parameters (Å, °) a = 104.2, b = 105.0, c = 119.1, β = 110.6 a = 104.0, b = 104.5, c = 108.4, β = 90
Rmerge 0.16 (0.34) 0.12 (0.45)
Rp.i.m. 0.11 (0.24) 0.07 (0.28)
Mean I/σ(I) 7.3 (2.3) 8.2 (2.3)
Completeness (%) 88.9 (90.5) 94.8 (81.8)
Multiplicity 2.8 (2.9) 4.0 (2.7)

R merge = Inline graphic Inline graphic Inline graphic; R p.i.m. = Inline graphic Inline graphic Inline graphic, where Ii(hkl) is the integrated intensity of a reflection, 〈I(hkl)〉 is the mean intensity of multiple corresponding symmetry-related reflections and N is the multiplicity of the given reflections.