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. 2011 Apr 29;67(Pt 5):o1217. doi: 10.1107/S1600536811013778
Enraf–Nonius CAD-4 diffractometer 2367 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tube Rint = 0.021
graphite θmax = 26.0°, θmin = 1.2°
ω/2θ scans h = −21→0
Absorption correction: ψ scan (North et al., 1968) k = 0→7
Tmin = 0.866, Tmax = 0.964 l = −20→21
3659 measured reflections 200 standard reflections every 3 reflections
3539 independent reflections intensity decay: 1%