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. 2011 Apr 7;67(Pt 5):o1052. doi: 10.1107/S1600536811011093
Enraf–Nonius CAD-4 diffractometer 1470 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tube Rint = 0.045
graphite θmax = 25.4°, θmin = 2.3°
ω/2θ scans h = 0→7
Absorption correction: ψ scan (North et al., 1968) k = −12→12
Tmin = 0.909, Tmax = 0.968 l = −20→20
4391 measured reflections 3 standard reflections every 200 reflections
2063 independent reflections intensity decay: 1%