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. Author manuscript; available in PMC: 2012 Apr 21.
Published in final edited form as: J Phys Chem C Nanomater Interfaces. 2011 Apr 21;115(19):9432–9441. doi: 10.1021/jp201213g

Table 1.

XPS determined elemental compositions for 14nm AuNP and flat Au surfaces with C6, C8, C11 and C16 COOH-SAMs. Data for AuNP samples were normalized without the Si signal and data for flat surfaces were normalized without the Zn signal, as discussed in the text.

Atomic % (Std. Dev.)
14nm Flat Au
C 1s C16 70.3 (0.7) 59.5 (0.6)
C11 60.2 (2.8) 49.0 (0.7)
C8 53.7 (0.5) 42.3 (0.4)
C6 43.7 (5.5) 38.1 (2.0)

Au 4f C16 19.2 (0.9) 29.2 (0.6)
C11 27.0 (2.7) 39.4 (1.6)
C8 33.8 (1.4) 44.3 (1.1)
C6 44.3 (9.7) 46.8 (2.8)

O 1s C16 9.0 (0.3) 10.0 (0.5)
C11 10.4 (0.1) 10.2 (1.0)
C8 9.5 (1.4) 11.7 (0.7)
C6 8.0 (4.3) 13.0 (1.7)

S 2p C16 1.5 (0.0) 1.3 (0.0)
C11 2.3 (0.0) 1.5 (0.1)
C8 3.0 (0.0) 1.7 (0.2)
C6 4.0 (0.1) 2.1 (0.3)