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. Author manuscript; available in PMC: 2012 Apr 21.
Published in final edited form as: J Phys Chem C Nanomater Interfaces. 2011 Apr 21;115(19):9432–9441. doi: 10.1021/jp201213g

Table 3.

Apparent overlayer thickness for Cx COOH-SAMs on flat Au and AuNP measured from XPS data acquired in the ‘hybrid’ and electrostatic modes at a nominal photoelectron take-off angle of 0°. The COOH-SAM thicknesses from the literature are also included in the table.50

AuNP Diameter [nm] COOH-SAM Chain Length dH [Å] (Std. Dev.) dE [Å] (Std. Dev.) dL (Å)
6 18 (5)
14 8 24 (1)
11 30 (4)
16 41 (2) 36

25 16 37 (1)

40 16 35 (1)

6 14 (2) 12 (1) 11
Flat Au 8 16 (1) 13 (1) 13
11 20 (1) 17 (3) 16
16 28 (1) 21 (1) 22

dH = d based on hybrid mode data

dE = d based on electrostatic mode data

dL = d based on literature