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. 2011 May 14;67(Pt 3):205–217. doi: 10.1107/S0108768111013814

Table 4. Quality of the fit to the diffraction data after refinements of models of increasing complexity.

Given are RF values of each order (|m|) of reflections, the number of parameters, max, min, the number of observed reflections N(obs) and the number of reflections N* with I > 5(I). Column Inline graphic gives R values of model Dr calculated for the N* reflections. Model A includes displacement modulations, model B adds modulations of harmonic ADPs, model C incorporates modulations of third-order ADPs while model Cr is restricted to significant third-order ADP parameters, and model Dr adds basic structure parameters for fourth-order anharmonic ADPs. For details see 2.2.

Present data Model A Model B Model Cr Model C Model Dr N(obs) Model Inline graphic N*
All 0.1047 0.0698 0.0634 0.0633 0.0563 6245 0.0525 5145
m = 0 0.0776 0.0606 0.0561 0.0560 0.0493 1825 0.0487 1773
|m| = 1 0.1227 0.0703 0.0651 0.0650 0.0561 2617 0.0537 2358
|m| = 2 0.2388 0.1218 0.0988 0.0963 0.0969 1088 0.0787 683
|m| = 3 0.4807 0.2565 0.2045 0.2030 0.2003 392 0.1708 215
|m| = 4 0.6203 0.3149 0.2890 0.3046 0.2987 86 0.2023 12
|m| = 5 0.3434 0.2137 0.1757 0.1771 0.1619 237 0.1278 104
No. of parameters 140 224 356 468 389      
max (e3) 4.85 2.11 2.17 2.18 1.71   1.74  
min (e3) 3.74 2.61 2.09 2.09 1.78   1.71