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. Author manuscript; available in PMC: 2011 Jun 6.
Published in final edited form as: Proc IEEE Inst Electr Electron Eng. 2010;98(3):375–388. doi: 10.1109/JPROC.2009.2038949

Fig. 7.

Fig. 7

Upper trace: Block diagram of the active device distribution within the implantable microsystem. Lower trace: cross-sectional photographic view of a fully encapsulated device, showing the location of the key components within the cortical and cranial units.