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. 2011 May 23;108(23):9326–9330. doi: 10.1073/pnas.1100977108

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Fig. 3. — Effect of the applied voltages and frequencies on the confinement of particles. Experiments are performed with 491-nm radius particles and R₀ = 4-μm devices. No dc voltages are applied (U = 0). (A) The x-y positions of a single particle trapped under a fixed frequency (f = 3 MHz) and three different voltages. (B) Radial probability histograms () corresponding to the datasets in A. P(r) is defined such that ∫P(r)2πrdr = 1. (C) The x-y positions of a single 490-nm radius particle trapped under a fixed voltage (V = 1.2 V) and three different frequencies. (D) Radial probability histograms corresponding to the datasets in C.

Inline graphic — Effect of the applied voltages and frequencies on the confinement of particles. Experiments are performed with 491-nm radius particles and R₀ = 4-μm devices. No dc voltages are applied (U = 0). (A) The x-y positions of a single particle trapped under a fixed frequency (f = 3 MHz) and three different voltages. (B) Radial probability histograms () corresponding to the datasets in A. P(r) is defined such that ∫P(r)2πrdr = 1. (C) The x-y positions of a single 490-nm radius particle trapped under a fixed voltage (V = 1.2 V) and three different frequencies. (D) Radial probability histograms corresponding to the datasets in C.