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. 2011 Feb;24(1):49–60. doi: 10.1089/jamp.2010.0843

FIG. 6.

FIG. 6.

(a) The variation of 24-h clearance with the estimated fractional deposition in generations 2–15. The line is the line of identity. (b) The variation of 24-h clearance with conducting airways deposition fraction assuming the definition of the conducting airways in the Weibel Model. The line is the line of identity.