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. Author manuscript; available in PMC: 2012 May 18.
Published in final edited form as: J Am Chem Soc. 2011 Apr 27;133(19):7450–7460. doi: 10.1021/ja111687t

Figure 5.

Figure 5

AFM height images of (A) HOCS layer on a silicon wafer, (B) [HOCS/SPEEK]1 without SWNT, (C) [HOCS/SPEEK-P2]1 with SWNT on top and (D) [HOCS/SPEEK-P2]1.5 with HOCS on top.