Table I. Random clone analysis of DSB repair events.
| V79 cell line | AA8 cell line | Total | |
|---|---|---|---|
| Clones analyzed | 200 | 100 | 300 |
| Clones which lost an I-SceI site | 27 | 15 | 42 |
| Repair productsa | |||
| STGC | 5 | 3 | 8 (19%)b |
| LTGC/SCEc | 4 | 2 | 6 (14%) |
| HD/SCEc | 1 | 3 | 4 (10%) |
| NHEJ | 17 | 7 | 24 (57%) |
aRepair products are described in Figure 1.
bThe percentage is equal to the number of clones with products in the specified category divided by the total number of clones that had lost the I-SceI site.
cSince LTGC/SCE and HD/SCE products were never found within the same clone, these products arose from LTGC and HD events, respectively, rather than from SCE events (see text).