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. 2011 Aug 3;101(3):709–717. doi: 10.1016/j.bpj.2011.06.024

Table 3.

Comparison of EM spacing data to XRD data

A-band
Z-band
EM
XRD
EM
EM/f
XRD
μ SA SA f SSS SBW SSS SBW SZ1 SZ2
Std 28.1 34.9 0.8 19.1 21.5 23.9 26.9 24.0 26.7
LIS 28.8 35.5 0.8 19.3 21.3 24.1 26.6 24.2 26.3

Comparison of lattice spacings measured by EM versus XRD in standard and low ionic strength, at 38° and with 3% dextran. EM and XRD data are repeated from Tables 1 and 2, respectively. Shrinkage factor, f, due to EM processing is derived by dividing A-band EM spacing by XRD spacing. This shrinkage factor is then applied to the Z-band EM spacings to give corrected values for small-square or basketweave (SSS or SBW), which correspond closely to the XRD measured spacings for the Z1 and Z2 reflections.