Table 3.
Comparison of EM spacing data to XRD data
| A-band |
Z-band |
||||||||
|---|---|---|---|---|---|---|---|---|---|
| EM |
XRD |
EM |
EM/f |
XRD |
|||||
| μ | SA | SA | f | SSS | SBW | S∗SS | S∗BW | SZ1 | SZ2 |
| Std | 28.1 | 34.9 | 0.8 | 19.1 | 21.5 | 23.9 | 26.9 | 24.0 | 26.7 |
| LIS | 28.8 | 35.5 | 0.8 | 19.3 | 21.3 | 24.1 | 26.6 | 24.2 | 26.3 |
Comparison of lattice spacings measured by EM versus XRD in standard and low ionic strength, at 38° and with 3% dextran. EM and XRD data are repeated from Tables 1 and 2, respectively. Shrinkage factor, f, due to EM processing is derived by dividing A-band EM spacing by XRD spacing. This shrinkage factor is then applied to the Z-band EM spacings to give corrected values for small-square or basketweave (S∗SS or S∗BW), which correspond closely to the XRD measured spacings for the Z1 and Z2 reflections.