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. 2011 May 11;20(7):1275–1284. doi: 10.1002/pro.655

Table I.

Statistical Analysis of Conservation Patterns for Charged Residue Pairs in Homologous Interfaces

Number of interface pairs Number of charged residue pairs % of total charged residue pairs



Type (A) (B) (A) (B) (A) (B)
No charge 843 90 0 0 0.00 0.00
1. Unconserved 934 143 1571 222 46.80 46.20
2. Conserved 891 139 560 50 16.68 10.40
3. Swapped 2 1 0.06 0.21
4.Correlated reappearance 1224 208 36.46 43.20
Total 2668 372 3357 481

The analysis was done for two redundancy levels: 100% (A) and 95% (B).