| Bruker SMART X2S diffractometer | 1695 independent reflections |
| Radiation source: XOS X-beam microfocus source | 1458 reflections with I > 2σ(I) |
| doubly curved silicon crystal | Rint = 0.052 |
| ω scans | θmax = 25.0°, θmin = 2.1° |
| Absorption correction: multi-scan (SADABS; Sheldrick, 2008b) | h = −6→6 |
| Tmin = 0.91, Tmax = 0.98 | k = −9→9 |
| 8624 measured reflections | l = −23→23 |
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