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. 2011 May 5;39(15):6764–6774. doi: 10.1093/nar/gkr283

Table 1.

Structural statistics on the final set of simulated annealing structures of Sso7c4

Constraints used
    Distance restraints
        Intra-residue 278
        Sequential 244
        Medium-range 70
        Long-range 174
        Intermolecular 124
        Hydrogen bonds
            Intramolecular 16
            Intermolecular 20
        Total distance restraints 926
    Dihedral angles
        Backbone ϕ,φ 40
Statistics for the final X-PLOR structures
    Number of structures in the final set 15
        X-PLOR energy (kcal/mol)
            ENOE 3.78 ± 1.81
            Ecdih 0.10 ± 0.12
            Ebond + Eangle + Eimproper 172.75 ± 8.30
            Eelec 0.85 ± 0.23
            EVDW 37.18 ± 3.91
            ENCS 0.42 ± 0.22
    NOE violations
        Number >0.5 Å none
        r.m.sa deviation (Å) 0.017
    Deviation from idealized covalent geometry
        Angle (°) 0.65 ± 0.02
        Impropers (°) 0.36 ± 0.02
        Bonds (Å) 0.005
    Mean global r.m.s deviation (Å)
        Backbone (N,Cα,C')
            Residues (secondary structure) 0.68 ± 0.18
            Residues (3–47) 0.89 ± 0.23
        Heavy atoms
            Residues (secondary structure) 1.40 ± 0.31
            Residues (3–47) 1.72 ± 0.39
    Ramachandran datab
        Residues in most favored regions (%) 70.2
        Residues in allowed regions (%) 21.3
        Residues in generously allowed regions (%) 8.5
        Residues in disallowed regions (%) 0

aRoot mean square.

bThese were calculated using the PROCHECK program.