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. Author manuscript; available in PMC: 2011 Aug 24.
Published in final edited form as: Ann Biomed Eng. 2010 Oct 6;39(1):44–52. doi: 10.1007/s10439-010-0176-2

FIGURE 6.

FIGURE 6

2D B-scans of non-stressed devices showing surface irregularities (arrows) in these two selected scan areas of the devices—due to positioning the devices. This resulted in higher (outlier) RMS values when processing the SAM scans and consequently, higher variations. Scale bars are 100 µm.