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. Author manuscript; available in PMC: 2012 Sep 1.
Published in final edited form as: Anal Chem. 2011 Jul 26;83(17):6704–6712. doi: 10.1021/ac201175a

Figure 5.

Figure 5

ΣXr2(N/F) showing comparisons of the XPS determined surface compositions of C16 COOH-SAMs on 14nm AuNP at 0° macroscopic photoelectron emission angle with (a) the SAM on flat Au measured at various photoelectron emission angles ranging from 5 to 85°; (b) the SAM on flat Au simulated at various photoelectron emission angles ranging from 5 to 85° using 1.1Å per CH2, RSA=1.05 and CH2-contamination thickness=1.5Å.