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. Author manuscript; available in PMC: 2012 Sep 1.
Published in final edited form as: Anal Chem. 2011 Jul 26;83(17):6704–6712. doi: 10.1021/ac201175a

Figure 6.

Figure 6

ΣXr2(N) comparison of XPS% with the SESSA% using Equation 2. The XPS data is from the C16 COOH-SAM on 14nm AuNPs. The SESSA data is from the C16 COOH-SAM on a flat Au surface, summed across all nine photoelectron emission angles using the geometric weighting factors. For the SESSA calculations the RSA and CH2-group thickness were varied and a 1.5Å thick hydrocarbon contamination overlayer was included in all calculations.