Figure 2. Powder X-ray diffraction (XRD) patterns and electrical properties.

(a) Measured powder XRD pattern of the SrGeO₃ sample synthesized at AP (black symbols) along with its simulation pattern (blue symbols). (b) Measured powder XRD patterns of the undoped (black symbols) and La-doped SrGeO₃ samples (red symbols) after the HP treatment. (c) SEM image of polished surface of HP-SrGeO₃ pellet. Scale bar shows 3 μm. (d) Temperature dependence of the electrical conductivities and (e) Seebeck coefficients for the undoped (black symbols) and the La-doped HP-SrGeO₃ (red symbols). Inset to e shows a photograph of the undoped HP-SrGeO₃ powder.