| Agilent Technologies SuperNova Dual diffractometer with Atlas detector | 3890 independent reflections |
| Radiation source: SuperNova (Mo) X-ray Source | 2953 reflections with I > 2σ(I) |
| mirror | Rint = 0.030 |
| Detector resolution: 10.4041 pixels mm-1 | θmax = 27.5°, θmin = 2.4° |
| ω scan | h = −9→11 |
| Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2010) | k = −26→28 |
| Tmin = 0.714, Tmax = 1.000 | l = −12→11 |
| 8688 measured reflections |
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