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. Author manuscript; available in PMC: 2011 Nov 3.
Published in final edited form as: Proc IEEE Comput Soc Conf Comput Vis Pattern Recognit. 2011 Jun 20;2011:1057–1064. doi: 10.1109/CVPR.2011.5995561

Figure 3.

Figure 3

Feature-guided seam matching in the moving image. The correspondences in I and I′ are shown with the colored crosses. From (a) we can see the seams SI″ and SI′ may have same cost values due to the similar structure they passed. Obviously, SI″ is not correct. We can use the matched features to guide the seam matching. For the point pSI, the features in a local region form a structure topology of p that help to reject incorrect matching. An example matched seam in the moving image is showed in (b). where Inline graphic denotes the neighboring system and β is the parameter to balance the two terms. Suppose label lp is defined by the displacement dp. let ΔII′ be (I(pI′(p + dp))2. The data term for each node on the interface seam S is defined, as follows.