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. 2011 Feb 23;6(1):168. doi: 10.1186/1556-276X-6-168

Figure 3.

Figure 3

TEY-XANES spectra for (a) PECVD, (b) ECR PECVD, and (c) ICP CVD AD films at the Si K-edge. A, B, and C indicate the peak positions for Si-Si, Si-N, and Si-O resonances, respectively. The percentages in the legend refer to the excess silicon content of the SRSN films.