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. 2011 Feb 23;6(1):168. doi: 10.1186/1556-276X-6-168

Figure 4.

Figure 4

FLY-XANES spectra for as-deposited (a) PECVD and (b) ICP CVD films at the Si L3,2-edge. The spectra are offset by a constant value in the order they are listed in the legend, in which the excess silicon content of the SRSN films is specified as a percentage. The Si-N resonance peak shifts to lower energies in films with higher excess silicon content.