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. 2011 Oct 4;6(1):545. doi: 10.1186/1556-276X-6-545

Figure 1.

Figure 1

Reduction and oxidation properties of electron-irradiated PCBM thin films, pristine PCBM measured by cyclic voltammetry. Cyclic voltammogram of cathodic scan (A) and anodic scan (B) of PCBM film after electron irradiation at different fluences of (a) 0, (b) 3.6 × 1016 cm-2, (c) 7.2 × 1016 cm-2, and (d) 1.44 × 1017 cm-2. (C) HOMO and LUMO levels of PCBM changed by electron irradiation as a function of electron fluence.