| Oxford Diffraction Xcalibur Eos Gemini diffractometer | 3978 independent reflections |
| Radiation source: Enhance (Cu) X-ray Source | 3869 reflections with I > 2σ(I) |
| graphite | Rint = 0.017 |
| Detector resolution: 16.1500 pixels mm-1 | θmax = 70.5°, θmin = 5.7° |
| ω scans | h = −6→6 |
| Absorption correction: multi-scan (CrysAlis RED; Oxford Diffraction, 2010) | k = −34→34 |
| Tmin = 0.792, Tmax = 0.887 | l = −9→8 |
| 6490 measured reflections |