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. 2011 Jul 30;67(Pt 8):o2172. doi: 10.1107/S1600536811029680
Agilent SuperNova Dual diffractometer with an Atlas detector 2589 independent reflections
Radiation source: SuperNova (Cu) X-ray Source 2482 reflections with I > 2σ(I)
mirror Rint = 0.021
Detector resolution: 10.4041 pixels mm-1 θmax = 74.1°, θmin = 5.2°
ω scans h = −11→7
Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2010) k = −14→11
Tmin = 0.857, Tmax = 0.969 l = −15→13
5335 measured reflections