Figure 5. Liquid-phase chacterization of (PS/SPS)n PEMs.
(a) Dynamic air-water contact angle measurements of (PrS/SPS)n PEMs. (b) In-situ spectroscopic ellipsometry thickness measurements of (PrS/SPS)n PEM functionalized silicon. (c) Liquid-phase AFM measurements of Young’s moduli obtained from hydrated (PrS/SPS)n PEM functionalized silicon surfaces.