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. 2008 Nov 12;9:476. doi: 10.1186/1471-2105-9-476

Figure 8.

Figure 8

Fragments and chaining for repeat analysis. (a) Four repeats in sequence S. (b) The repeats occur as MEMs in a self-comparison of sequence S. Fragment f4 cannot be appended to the chain f1, f2, f3 because the first instance of f4 overlaps with the second instance of f1.