Figure 8.
(a) LPV measurement in MS structure of Co(3.5 nm)/Si as a function of laser power with different light wavelength, where “ER” and “TR” represent the experimental results and theoretical results, respectively. (b) LPV measurement in MS structure of Co(3.5 nm)/Si as a function of light wavelength in Co(3.5 nm)/Si structure, where the light power is 5 mW. Here the contacts’ distance is 3.2 mm. Solid lines are the plots of Equation (23) and Equation (24), where the parameters are chosen as Eg = 1.12 (eV), d0 = 2.9 (nm), α = 0.5, β = 2 and P = 0.5.