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. 2011 Feb 24;11(3):2282–2303. doi: 10.3390/s110302282

Table 1.

Times associated with the Internal Pipeline of Figure 4.

Time (s) Description

T1 = 17 ·TCLK_CMOS Latency from giving the signal to shoot a new image with null exposure time.
T2 = 134 · TCLK_CMOS Time to write one row in FIFO buffer.
T3 = 4 ·TCLK_CMOS Latency before decimation.
T4=(ROW_SIZED)TCLK_CMOS Time to decimate one row
T5 = (BURST_SIZE + 23) · TCLK_CMOS Time to package one burst in FIFO buffer.
T6 = ((BURST_SIZE + 255) · TCLK_SYS) + ΔT6 Time to write one pixel burst into memory.
  T7 = ((BURST_SIZE + 255) · TCLK_SYS) + ΔT7 Time to read one pixel burst in memory
T8 = f (hw_proc) HW processing time of one pixel burst.
T9 Memory access time between HW processing of pixel bursts. Includes memory access latency.

T10 = f (sw_proc) SW processing time of one pixel burst loaded in Cache Memory.

T11 Memory access time to update one pixel burst for SW processing in Cache Memory
where:
  • TCLK_CMOS: CMOS controller clock signal period (fCLK_CMOS = 66 MHz).
  • TCLK_SYS: clock signal period of the architecture’s internal buses (fCLK_SYS = 100 MHz).
  • ROW_SIZE: number of pixels per column in the CMOS sensor (1,280 pixels).
  • COL_SIZE: number of pixels per row in the CMOS sensor (1,024 pixels).
  • D: decimation factor (1 to 10).
  • BURST_SIZE: number of words for access memory with a pixel burst.
  • N: number of bytes per word of the memory data write bus (4 bytes/word).
  • ΔT6: memory write latency.
  • ΔT7: memory read latency.