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. 2011 Nov 25;67(Pt 12):1551–1555. doi: 10.1107/S174430911104108X

Table 1. Crystal parameters and X-ray diffraction data-collection statistics.

Values in parentheses are for the highest resolution shell.

Space group P3212
Unit-cell parameters (Å) a = b = 57.2, c = 107.9
Resolution range (Å) 47.58–2.50 (2.66–2.50)
No. of measurements 21852
No. of unique reflections 11262 (1750)
Completeness (%) 98.7 (97.5)
VM (Å3 Da−1) 2.17
Solvent content (%) 43
〈I/σ(I)〉 38.3 (6.2)
Rmerge (%)† 6.4 (18.4)
Average multiplicity 10.3 (7.3)
†

R merge = Inline graphic Inline graphic, where I i(hkl) is the value of the ith measurement of the intensity of reflection hkl, 〈I(hkl)〉 is the average integrated intensity obtained from multiple measurements and the summation is over all observed reflections.