Table 1. Diffraction data statistics for FlgE79cj crystals.
Values in parentheses are for the highest resolution shell.
| Native | SeMet peak | SeMet edge | |
|---|---|---|---|
| X-ray source | BL41XU, SPring-8 | BL44XU, SPring-8 | |
| CCD detector | Rayonix MX225HE | ||
| Space group | P21 | P21 | P21 |
| Unit-cell parameters | |||
| a (Å) | 75.26 | 75.45 | 75.45 |
| b (Å) | 173.21 | 173.76 | 173.76 |
| c (Å) | 146.94 | 147.69 | 147.69 |
| β (°) | 102.67 | 102.98 | 102.98 |
| Wavelength (Å) | 1.0 | 0.9791 | 0.9794 |
| No. of images | 180 | 180 | 180 |
| Resolution (Å) | 32.09–2.50 (2.64–2.50) | 37.69–2.60 (2.74–2.60) | 37.71–2.60 (2.74–2.60) |
| Completeness (%) | 97.3 (94.6) | 99.9 (99.9) | 100 (100) |
| Total reflections | 440763 (58820) | 434336 (61878) | 435907 (62299) |
| Unique reflections | 123178 (17416) | 113491 (16522) | 113633 (16564) |
| Multiplicity | 3.6 (3.4) | 3.8 (3.7) | 3.8 (3.8) |
| Rmerge† (%) | 8.6 (39.9) | 13.0 (45.6) | 13.7 (52.1) |
| Mean I/σ(I) | 11.0 (3.1) | 8.0 (3.0) | 7.4 (2.7) |
†
R
merge = 
, where Ii(hkl) is the intensity of the ith measurement of reflection hkl and 〈I(hkl)〉 is the mean value of Ii(hkl) for all i measurements.