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. Author manuscript; available in PMC: 2011 Dec 8.
Published in final edited form as: Langmuir. 2011 Mar 21;27(8):4848–4856. doi: 10.1021/la104853t

Table 1.

Average Concentrations (atom %) of Elements Present on Surface of Titanium Samples as Determined by XPSa

Ti O C N Ge F
pristine Tib 26.33 59.53 14.09 0.05 0.00 0.00
surface A 11.33 31.71 53.68 0.0 3.28 0.00
surface B 5.37 25.31 63.56 3.19 0.12 2.45
surface C 6.64 30.46 60.69 2.12 0.09 0.00
surface D1 5.28 24.05 66.88 3.24 0.05 0.00
surface D2 4.82 22.25 68.92 3.97 0.04 0.00
a

After correction by the corresponding elemental sensitivity factors and expressed in percent.

b

Depending on samples, traces of Si and Ca elements may be present on the surface.