Table 1.

Illustration of data censoring and estimation of implant failure using the Kaplan-Meier (KM) and cumulative incidence methods

			KM method			Cumulative incidence method
A	B	C	D	E	F	G	H	I	J	K
2	3	Dead	Censored	0 × 1/5	0	Competing event	0 × 1/5	0	1 × 1/5	20
3	5	Revised	Event	1 × 1/4	25	Event	1 × 1/5	20	0 × 1/5	0
5	7	Dead	Censored	0 × 1/3	25	Competing event	0 × 1/5	20	1 × 1/5	40
4	10	Alive	Censored	0 × 1/2	25	Censored	0 × 1/5	20	0 × 1/5	40
1	10	Alive	Censored	0 × 1/1	25	Censored	0 × 1/5	20	0 × 1/5	40

A Patient

B Follow-up time (years)

C Status at the end of follow-up

D Status

E Contribution

F Cumulative implant failure (%)

G Status

H Contribution

I Cumulative implant failure (%)

J Contribution

K Cumulative death %