Bruker APEXII diffractometer	2950 independent reflections
Radiation source: TXS rotating anode	1981 reflections with I > 2σ(I)
multi-layer optics	Rint = 0.024
ω scans	θmax = 27.5°, θmin = 2.9°
Absorption correction: multi-scan (SORTAV; Blessing, 1995)	h = −10→10
Tmin = 0.986, Tmax = 0.992	k = −11→11
12243 measured reflections	l = −12→12