| Agilent SuperNova dual radiation CCD diffractometer | 6985 independent reflections |
| Radiation source: SuperNova (Cu) X-ray Source | 6452 reflections with I > 2σ(I) |
| mirror | Rint = 0.022 |
| Detector resolution: 10.3801 pixels mm-1 | θmax = 76.7°, θmin = 2.5° |
| ω scans | h = −12→12 |
| Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2011) | k = −12→12 |
| Tmin = 0.334, Tmax = 1.000 | l = −22→22 |
| 35399 measured reflections |
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