Figure 6.
The plot of 
versus d2(P, T) for X-ray diffraction data on nano-Ni. In all panels, the highly scattered raw data are shown as the open black circles. The data corrected by DER2 = (Ehkl/E200)2 and by DER2 = (Ehkl/E111)2 are shown, respectively, as solid blue and dark cyan symbols. The solid straight lines show the linear regression results of the DER2 corrected data, with the ordinate intercept providing apparent strains and the plot slopes providing gain size information. The strains (ε) and grain sizes (L) given in all panels are the values averaged from the (Ehkl/E200)2 and the (Ehkl/E111)2 corrections. The red arrows indicate the experimental path. The strain (normalized) and grain size data derived for all experimental pressures are shown in Figs. 7 and 8, respectively