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. 2009 Nov 17;42(Pt 6):1165–1175. doi: 10.1107/S0021889809042277

Figure 6.

Figure 6

R merge and 〈I/σ(I)〉 plotted against resolution shell. Statistics of CCD and CMOS data are plotted as open circles and open triangles, respectively. Open rectangles represent CCD data collected to examine the effect of sample radiation damage.