| Agilent SuperNova Dual diffractometer with an Atlas detector | 757 independent reflections |
| Radiation source: SuperNova (Cu) X-ray Source | 750 reflections with I > 2σ(I) |
| Mirror | Rint = 0.014 |
| Detector resolution: 10.4041 pixels mm-1 | θmax = 76.7°, θmin = 6.2° |
| ω scan | h = −17→17 |
| Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2010) | k = −11→10 |
| Tmin = 0.342, Tmax = 1.000 | l = −10→12 |
| 2323 measured reflections |