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. 2011 Dec 21;68(Pt 1):o193. doi: 10.1107/S1600536811053268
Agilent SuperNova Dual diffractometer with an Atlas detector 757 independent reflections
Radiation source: SuperNova (Cu) X-ray Source 750 reflections with I > 2σ(I)
Mirror Rint = 0.014
Detector resolution: 10.4041 pixels mm-1 θmax = 76.7°, θmin = 6.2°
ω scan h = −17→17
Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2010) k = −11→10
Tmin = 0.342, Tmax = 1.000 l = −10→12
2323 measured reflections