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. 2012 Jan 13;7(1):e30106. doi: 10.1371/journal.pone.0030106

Figure 1. Phase diagram showing STM induced surface modifications at different tip voltage Inline graphic and different tip-to-surface distance Inline graphic mainly constructed using ref. [5], [12] and ref. [17].

Figure 1

In drawing the lines for mound formation we have assumed that it is the electric field Inline graphic that decides if some particular kind of mound will be formed. Mounds will form at positive voltages, area A. From our model assuming field induced diffusion of adatoms we can calculate the threshold electric field for mound formation for area A to Inline graphic2 V/nm. In area B we have transfer of tip materials to the surface making a mound of tip material on the surface. For pits, area C, we have assumed that they are formed at constant Inline graphic independent of the tip-to-surface distance Inline graphic in agreement with Kondo et al. [17]. At short distances and low electric fields, area D, the van der Waals force will contribute in creating a mound [22]. Close to the U-axis (not shown) at electrical fields above 20–50 V/nm field evaporation will occur [18].