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. 2009 Oct 26;9(11):8382–8390. doi: 10.3390/s91108382

Figure 2.

Figure 2.

Ultimate detection limit for a resonance in a silicon structure infiltrated by water. The different traces show results for varying values of the light-liquid overlap f. The dashes lines show the imaginary part of the refractive index for water and silicon, respectively. Based on data for water and silicon from [20, 26].