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. 2012 Jan 17;3:629. doi: 10.1038/ncomms1640

Figure 1. Experimental set-up.

Figure 1

(a) A schematic illustration of the Ni81Fe19/p-Si film used in this study. H represents an external magnetic field. (b) Current-voltage (IV) characteristic measured for the Ni81Fe19/p-Si film, where the two electrodes are attached to the AuPd layers. wF is the length of the Ni81Fe19 layer. (c) IV characteristic measured for the Ni81Fe19/p-Si film. The two electrodes are attached to the Ni81Fe19 layer and AuPd layer, respectively.