Figure 3.
FIB SE images of sample B and sample C. (a, b) Before ion beam sputtering and (c, d) after ion beam sputtering. The insets in figure manifest the high-magnification image of the single SiMW of each sample.
Official websites use .gov
A
.gov website belongs to an official
government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you've safely
connected to the .gov website. Share sensitive
information only on official, secure websites.