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. 2011 Dec 14;6(1):629. doi: 10.1186/1556-276X-6-629

Figure 1.

Figure 1

AFM top view and cross-section profile of the structures fabricated by the FIS method. Nanoparticle deposition, results in nanoparticle accumulation, shown by the small peak at the top of the structures, (pointing-arrows).