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. 2009 Oct 21;9(10):8336–8348. doi: 10.3390/s91008336

Figure 5.

Figure 5.

(a) The measured ID-VSB characteristics of the ISFET for various VGB. (b) The measured efficiency (ID/IS) against VGB of the ISFET when IS is fixed at 10 μA. Operation modes are changed from MOS mode to the LBJT mode by increasing the gate voltage.