Table 2.
Source | Assemblya | Gene | Relative surfactant production ± SDb |
---|---|---|---|
From screen | Class I | fleQ | 0 ± 0.00** |
Targeted mutant | Class I | fleQ | 0 ± 0.00** |
Targeted mutant | Class I and IV | fleQ or fliC | 0 ± 0.00** |
Targeted mutant | Class I | fliA | 0.36 ± 0.13** |
Targeted mutant | Class II | fliF | 0.27 ± 0.16** |
From screen | Class III | flgC | 0.36 ± 0.13** |
Targeted mutant | Class III | flgD | 0.33 ± 0.15** |
From screen | Class IV | fliC | 1.22 ± 0.29* |
From screen | fgt1 | 1.19 ± 0.27* | |
From screen | fgt2 | 1.25 ± 0.26** |
Assembly class designations are given according to those given by Dasgupta et al. (9) for Pseudomonas aeruginosa.
Relative surfactant production is expressed as the average surfactant halo radius measured for the mutant divided by the average halo size measured for the ΔsyfA mutant; all averages were calculated from six replicate cultures. Halos were significantly different from the wild type at P < 0.05 (*) or P < 0.01 (**) as determined by a t test.