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. 2012 Feb 1;2012:870196. doi: 10.1155/2012/870196

Table 1.

Precision analysis: summary of the group-average statistics for the signed distance (SD) and absolute distance (AD) measure (in mm) between test and retest surfaces (surface: DF—DELFMAP, FS—FreeSurfer; L/R: left/right hemisphere; mean: a group average of a surface-wise mean of the distance; stdev: a group average of a surface-wise stdev of the distance; “>X mm (%)”: (group-average) percentage of surface points where AD was greater than X mm; values in parentheses indicate the statistical spread within the group, measured by the group-wise stdev).

Surface L/R Signed distance Absolute distance
Mean (mm) stdev (mm) Mean (mm) stdev (mm) >1 mm (%) >2 mm (%)
DF pial L −0.02 (0.03) 0.35 (0.06) 0.24 (0.02) 0.25 (0.04) 1.4 (0.3) 0.2 (0.1)
R −0.01 (0.04) 0.37 (0.09) 0.25 (0.02) 0.26 (0.06) 1.5 (0.4) 0.2 (0.2)
FS pial L −0.02 (0.04) 0.37 (0.10) 0.24 (0.02) 0.28 (0.06) 1.9 (0.4) 0.3 (0.2)
R −0.03 (0.04) 0.39 (0.13) 0.24 (0.03) 0.29 (0.08) 2.0 (0.4) 0.3 (0.2)
DF white L −0.01 (0.07) 0.34 (0.08) 0.24 (0.02) 0.24 (0.05) 1.0 (0.3) 0.2 (0.1)
R +0.02 (0.06) 0.35 (0.11) 0.24 (0.03) 0.24 (0.07) 1.0 (0.3) 0.2 (0.2)
FS white L +0.02 (0.02) 0.31 (0.10) 0.19 (0.02) 0.23 (0.07) 1.0 (0.3) 0.2 (0.2)
R +0.01 (0.02) 0.31 (0.13) 0.19 (0.03) 0.23 (0.08) 0.9 (0.3) 0.2 (0.2)