| Agilent Xcalibur Eos diffractometer | 2662 independent reflections |
| Radiation source: Enhance (Mo) X-ray Source | 2059 reflections with I > 2σ(I) |
| Graphite monochromator | Rint = 0.025 |
| Detector resolution: 16.0874 pixels mm-1 | θmax = 26.4°, θmin = 3.2° |
| ω scans | h = −19→13 |
| Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2011) | k = −8→8 |
| Tmin = 0.99, Tmax = 1.00 | l = −15→15 |
| 5907 measured reflections |
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