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. Author manuscript; available in PMC: 2013 May 1.
Published in final edited form as: Optom Vis Sci. 2012 May;89(5):E652–E666. doi: 10.1097/OPX.0b013e318238c34e

Figure 5.

Figure 5

The limits of agreement between RNFL thickness by Spectralis and Cirrus SD-OCT instruments, using the manufacturer’s thickness algorithms. A. The Bland-Altman plot for the agreement between global thickness measurements. B. Thickness measures from the two instruments and their deviation from the 1:1 line. C-E. Bland-Altman plots to illustrate the limits of agreement for each quadrant, demonstrating that the relationship between the thickness difference and average thickness is not statistically significant, except the nasal quadrant (E, slope = 0.51, intercept = −27.19, R2 = 0.34, p < 0.01).