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. Author manuscript; available in PMC: 2013 May 1.
Published in final edited form as: Optom Vis Sci. 2012 May;89(5):E652–E666. doi: 10.1097/OPX.0b013e318238c34e

Figure 6.

Figure 6

The limits of agreement between RNFL thickness by Spectralis and Cirrus SD-OCT instruments, using custom algorithms for scaling, rotation, registration, and segmentation, but without vessel compensation. Other details are as Fig. 5. The Bland-Altman analysis for RNFL thickness via custom image analysis demonstrates well correlated measurements and high ICCs for all quadrants with no statistical relationship between the thickness difference and average thickness. E. For the nasal quadrant, the difference in thickness measures between instruments did not have a systematic trend (slope = 0.02, intercept = −1.9, R2 < 0.01, p = 0.75).